Some methodological aspects of studying ohmic contacts to n-InP

Novytsкyі, S. V. (2013) Some methodological aspects of studying ohmic contacts to n-InP. materials of a conf. [XIV International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIV)], (Ivano-Frankivsk, Ukraine, 20—25 may 2013 y.). p. 437.

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Abstract

About some methodological aspects of studying ohmic contacts to n-InP

Item Type: Article
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Physics and Mathematics > Department of Physics and Labor Protection
Depositing User: С.В. Новицький
Date Deposited: 18 Apr 2014 06:28
Last Modified: 02 Feb 2016 22:57
URI: http://eprints.zu.edu.ua/id/eprint/11039

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