Effect of thermal annealing on the electrical parameters of ohmic contacts to n-n+-n++-InP

Novytsкyі, S. V. (2011) Effect of thermal annealing on the electrical parameters of ohmic contacts to n-n+-n++-InP. Materials of a conf. [XIII International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIII)]Ivano-Frankivsk, Ukraine, 16—21 May 2011 y.), 1. p. 112.

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Item Type: Article
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Physics and Mathematics > Department of Physics and Labor Protection
Depositing User: С.В. Новицький
Date Deposited: 16 Apr 2014 07:23
Last Modified: 15 Aug 2015 06:16
URI: http://eprints.zu.edu.ua/id/eprint/11040

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