Zinovchuk, A. V., Tkachenko, A. K. (2011) Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission. Semiconductors, 45 (1). pp. 61-65. ISSN 1063-7826
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| Item Type: | Article |
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| Subjects: | Q Science > QC Physics |
| Divisions: | Faculty of Physics and Mathematics > Department of Physics and Its Teaching Methods |
| Depositing User: | Богдан Свищ |
| Date Deposited: | 30 Mar 2016 13:14 |
| Last Modified: | 30 Mar 2016 13:14 |
| URI: | http://eprints.zu.edu.ua/id/eprint/20653 |
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