A new mechanism of contact resistance formation in ohmic contacts to semiconductors with high dislocation densityА. V.SachenкoauthorА. Е.BelyaevauthorN. S.BoltovetsauthorR. V.KonaкovaauthorY. Y.KudryкauthorS. V.NovytsкyіauthorV. N.SheremetauthorJ.LіauthorS. А.VіtusevіchauthorAbout new mechanism of contact resistance formation in ohmic contacts to semiconductors with high dislocation density QC PhysicsTK Electrical engineering. Electronics Nuclear engineering2012-07Zurich, SwitzerlandArticle