<ctx:context-object xsi:schemaLocation="info:ofi/fmt:xml:xsd:ctx http://www.openurl.info/registry/docs/info:ofi/fmt:xml:xsd:ctx" timestamp="2016-02-02T22:57:19Z" xmlns:ctx="info:ofi/fmt:xml:xsd:ctx" xmlns:xsi="http://www.w3.org/2001/XML"><ctx:referent><ctx:identifier>info:oai:eprints.zu.edu.ua:11039</ctx:identifier><ctx:metadata-by-val><ctx:format>info:ofi/fmt:xml:xsd:journal</ctx:format><ctx:metadata><jnl:journal xsi:schemaLocation="info:ofi/fmt:xml:xsd:journal http://www.openurl.info/registry/docs/info:ofi/fmt:xml:xsd:journal" xmlns:jnl="info:ofi/fmt:xml:xsd:journal"><jnl:authors><jnl:author><jnl:aulast>Novytsкyі</jnl:aulast><jnl:aufirst>S. V.</jnl:aufirst><jnl:au>Novytsкyі, S. V.</jnl:au></jnl:author></jnl:authors><jnl:date>May 2013</jnl:date><jnl:atitle>Some methodological aspects of studying ohmic contacts to n-InP</jnl:atitle><jnl:title>materials of a conf. [XIV International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIV)], (Ivano-Frankivsk, Ukraine, 20—25 may 2013 y.)</jnl:title><jnl:pages>437</jnl:pages><jnl:genre>article</jnl:genre></jnl:journal></ctx:metadata></ctx:metadata-by-val></ctx:referent></ctx:context-object>