eprintid: 11039
rev_number: 21
eprint_status: archive
userid: 11
dir: disk0/00/01/10/39
datestamp: 2014-04-18 06:28:01
lastmod: 2016-02-02 22:57:19
status_changed: 2014-04-18 06:28:01
type: article
metadata_visibility: show
title: Some methodological aspects of studying ohmic contacts to n-InP
language: english
abstract: About some methodological aspects of studying ohmic contacts to n-InP
creators_name: Novytsкyі, S. V.
ispublished: pub
subjects: QC
subjects: TK
divisions: sch_phy
full_text_status: public
date: 2013-05
publication: materials of a conf. [XIV International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIV)], (Ivano-Frankivsk, Ukraine, 20—25 may 2013 y.)
publisher: Ivano-Frankivsk
pagerange: 437
refereed: TRUE
citation:   Novytsкyі, S. V.  (2013) Some methodological aspects of studying ohmic contacts to n-InP.  materials of a conf. [XIV International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIV)], (Ivano-Frankivsk, Ukraine, 20—25 may 2013 y.).  с. 437.      
document_url: http://eprints.zu.edu.ua/11039/1/1230001.pdf