eprintid: 11040
rev_number: 15
eprint_status: archive
userid: 11
dir: disk0/00/01/10/40
datestamp: 2014-04-16 07:23:19
lastmod: 2015-08-15 06:16:33
status_changed: 2014-04-16 07:23:19
type: article
metadata_visibility: show
title: Effect of thermal annealing on the electrical parameters of ohmic contacts to n-n+-n++-InP
language: english
creators_name: Novytsкyі, S. V.
ispublished: pub
subjects: QC
subjects: TK
divisions: sch_phy
full_text_status: public
date: 2011-05
date_type: published
publication: Materials of a conf. [XIII International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIII)]Ivano-Frankivsk, Ukraine, 16—21 May 2011 y.)
volume: 1
publisher: Ivano-Frankivsk
pagerange: 112
refereed: TRUE
citation:   Novytsкyі, S. V.  (2011) Effect of thermal annealing on the electrical parameters of ohmic contacts to n-n+-n++-InP.  Materials of a conf. [XIII International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIII)]Ivano-Frankivsk, Ukraine, 16—21 May 2011 y.), 1.  с. 112.      
document_url: http://eprints.zu.edu.ua/11040/1/%D0%86%D0%B2%D0%B0%D0%BD%D0%BE-%D0%A4%D1%80%D0%B0%D0%BD%D0%BA%D1%96%D0%B2%D1%81%D1%8C%D0%BA%202011.pdf