?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.au=Zinovchuk%2C+A.+V.&rft.aulast=Zinovchuk&rft.aufirst=A.+V.&rft.issue=1&rft.volume=45&rft.date=2011&rft.issn=1063-7826&rft.atitle=Measurement+of+Surface+Recombination+Velocity+and+Bulk+Lifetime+in+Si+Wafers+by+the+Kinetics+of+Excess+Thermal+Emission&rft.title=Semiconductors&rft.pages=61-65&rft.genre=article