relation: http://eprints.zu.edu.ua/20653/
title: Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission
creator: Zinovchuk, A. V.
creator: Tkachenko, A. K.
subject: QC Фізика
publisher: Springer
date: 2011
type: Стаття
type: PeerReviewed
format: text
language: uk
identifier: http://eprints.zu.edu.ua/20653/1/Semicnd1101024ZinovchukLO.pdf
identifier:   Zinovchuk, A. V., Tkachenko, A. K.  (2011) Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission.  Semiconductors, 45 (1).  с. 61-65.  ISSN 1063-7826     
language: english