%0 Journal Article
%@ 1063-7826
%A Zinovchuk, A. V.
%A Tkachenko, A. K.
%D 2011
%F zu2:20653
%I Springer
%J Semiconductors
%N 1
%P 61-65
%T Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission
%U http://eprints.zu.edu.ua/20653/
%V 45