<> "The repository administrator has not yet configured an RDF license."^^ . <> . . . "Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission"^^ . "2011" . . "45" . "1" . . "Springer"^^ . . . "Semiconductors"^^ . . . "10637826" . . . . . . . . . . "A. K."^^ . "Tkachenko"^^ . "A. K. Tkachenko"^^ . . "A. V."^^ . "Zinovchuk"^^ . "A. V. Zinovchuk"^^ . . . . . . "Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission (Text)"^^ . . . "Semicnd1101024ZinovchukLO.pdf"^^ . . . "Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission (Інший)"^^ . . . . . . "indexcodes.txt"^^ . . . "Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission (Інший)"^^ . . . . . . "lightbox.jpg"^^ . . . "Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission (Інший)"^^ . . . . . . "preview.jpg"^^ . . . "Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission (Інший)"^^ . . . . . . "medium.jpg"^^ . . . "Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission (Інший)"^^ . . . . . . "small.jpg"^^ . . "HTML Summary of #20653 \n\nMeasurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission\n\n" . "text/html" . . . "QC Physics"@en . "QC Фізика"@uk . .