TY  - JOUR
ID  - zu220653
UR  - http://eprints.zu.edu.ua/20653/
IS  - 1
A1  - Zinovchuk, A. V.
A1  - Tkachenko, A. K.
Y1  - 2011///
PB  - Springer
JF  - Semiconductors
VL  - 45
SN  - 1063-7826
TI  - Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission
SP  - 61
AV  - public
EP  - 65
ER  -