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Items where Author is "Tkachenko, A. K."

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Article

Zinovchuk, A. V. and Tkachenko, A. K. (2011) Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission. Semiconductors, 45 (1). pp. 61-65. ISSN 1063-7826

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