Novytsкyі S. V. (2013) Some methodological aspects of studying ohmic contacts to n-InP. materials of a conf. [XIV International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIV)], (Ivano-Frankivsk, Ukraine, 20—25 may 2013 y.). p. 437.
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Abstract
About some methodological aspects of studying ohmic contacts to n-InP
| Item Type: | Article |
|---|---|
| Subjects: | Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Faculty of Physics and Mathematics > Department of Physics and Methods of Its Teaching |
| Depositing User: | С.В. Новицький |
| Date Deposited: | 18 Apr 2014 09:28 |
| Last Modified: | 03 Feb 2016 00:57 |
| URI: | https://eprints.zu.edu.ua/id/eprint/11039 |
| ДСТУ 8302:2015: | Novytsкyі S. V. Some methodological aspects of studying ohmic contacts to n-InP. materials of a conf. [XIV International conf. «Physics and technology of thin films and nanosystems» (ICPTTFN-XIV)], (Ivano-Frankivsk, Ukraine, 20—25 may 2013 y.). 2013. p. 437. |
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